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[IEEE 2015 IEEE International Electron Devices Meeting (IEDM) - Washington, DC, USA (2015.12.7-2015.12.9)] 2015 IEEE International Electron Devices Meeting (IEDM) - A new surface potential based physical compact model for GFET in RF applications
Wang, Lingfei, Peng, Songang, Zong, Zhiwei, Li, Ling, Wang, Wei, Xu, Guangwei, Lu, Nianduan, Ji, Zhuoyu, Jin, Zhi, Liu, MingAnnée:
2015
Langue:
english
DOI:
10.1109/IEDM.2015.7409788
Fichier:
PDF, 581 KB
english, 2015