Mechanical Testing of Bonded Silicon on Insulator Wafers.
Farrepi, S. N., Roberds, B., Boettcher, M. C., Ismail, M. S., Bower, R. W., Desmond, C. A., Hunt, C. E.Volume:
239
Langue:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-239-287
Date:
January, 1991
Fichier:
PDF, 1.40 MB
english, 1991