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Investigations of Buried Interfaces Using High Energy X-Ray Reflectivity
Rieutord, F., Eymery, J., Plantevin, O., Bataillou, B., Buttard, D., Fournel, F.Volume:
678
Langue:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-678-ee9.9.1
Date:
January, 2001
Fichier:
PDF, 87 KB
english, 2001