Strain Measurement in Semiconductor Heterostructures by Scanning Transmission Electron Microscopy
Müller, Knut, Rosenauer, Andreas, Schowalter, Marco, Zweck, Josef, Fritz, Rafael, Volz, KerstinVolume:
18
Langue:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927612001274
Date:
October, 2012
Fichier:
PDF, 1.03 MB
english, 2012