[ACM Press the Knowledge Capture Conference - Palisades, NY, USA (2015.10.07-2015.10.10)] Proceedings of the Knowledge Capture Conference on ZZZ - K-CAP 2015 - Automatically Predicting Quiz Difficulty Level Using Similarity Measures
Lin, Chenghua, Liu, Dong, Pang, Wei, Apeh, EdwardAnnée:
2015
Langue:
english
DOI:
10.1145/2815833.2815842
Fichier:
PDF, 629 KB
english, 2015