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SPIE Proceedings [SPIE IS&T/SPIE Electronic Imaging - Burlingame, California, USA (Sunday 3 February 2013)] Image Processing: Machine Vision Applications VI - Defect inspection technology for a gloss-coated surface using patterned illumination
Nagato, Tsuyoshi, Fuse, Takashi, Koezuka, Tetsuo, Bingham, Philip R., Lam, Edmund Y.Volume:
8661
Année:
2013
Langue:
english
DOI:
10.1117/12.2001768
Fichier:
PDF, 770 KB
english, 2013