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[IEEE 2015 IEEE Applied Imagery Pattern Recognition Workshop (AIPR) - Washington, DC, USA (2015.10.13-2015.10.15)] 2015 IEEE Applied Imagery Pattern Recognition Workshop (AIPR) - Efficient dense reconstruction using geometry and image consistency constraints
Shashkov, Mikhail M., Mak, Jason, Recker, Shawn, Nguyen, Connie, Owens, John, Joy, Kenneth I.Année:
2015
Langue:
english
DOI:
10.1109/aipr.2015.7444539
Fichier:
PDF, 10.04 MB
english, 2015