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Use of optical spacers to enhance infrared Mueller ellipsometry sensitivity: application to the characterization of organic thin films
Ndong, Gerald, Lizana, Angel, Garcia-Caurel, Enric, Paret, Valerie, Melizzi, Géraldine, Cattelan, Denis, Pelissier, Bernard, Tortai, Jean-HervéVolume:
55
Langue:
english
Journal:
Applied Optics
DOI:
10.1364/AO.55.003323
Date:
April, 2016
Fichier:
PDF, 978 KB
english, 2016