LER: Least Error Rate Replacement Algorithm for Emerging STT-RAM Caches
Monazzah, Amir, Farbeh, Hamed, Miremadi, SeyedAnnée:
2016
Langue:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/TDMR.2016.2562021
Fichier:
PDF, 1.13 MB
english, 2016