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Ablation depth control with 40 nm resolution on ITO thin films using a square, flat top beam shaped femtosecond NIR laser
Kim, Hoon-Young, Yoon, Ji-Wook, Choi, Won-Suk, Kim, Kwang-Ryul, Cho, Sung-HakVolume:
84
Langue:
english
Journal:
Optics and Lasers in Engineering
DOI:
10.1016/j.optlaseng.2016.03.025
Date:
September, 2016
Fichier:
PDF, 3.59 MB
english, 2016