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[IEEE 2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) - Wien, Vienna, Austria (2016.1.25-2016.1.27)] 2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) - Impact of the design layout on threshold voltage in SiGe channel UTBB-FDSOI pMOSFET
Berthelon, R., Andrieu, F., Ortolland, S., Nicolas, R., Poiroux, T., Baylac, E., Dutartre, D., Josse, E., Claverie, A., Haond, M.Année:
2016
Langue:
english
DOI:
10.1109/ULIS.2016.7440059
Fichier:
PDF, 421 KB
english, 2016