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[IEEE 2015 15th International Conference on Control, Automation and Systems (ICCAS) - Busan, Korea (South) (2015.10.13-2015.10.16)] 2015 15th International Conference on Control, Automation and Systems (ICCAS) - Development of a supporting system for visual inspection of IGBT device based on statistical feature and complex multi-resolution analysis
Yuki, Daisuke, Kim, Hyoungseop, Tan, Joo Kooi, Ishikawa, Seiji, Tsukuda, Masanori, Omura, IchiroAnnée:
2015
Langue:
english
DOI:
10.1109/iccas.2015.7364603
Fichier:
PDF, 662 KB
english, 2015