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[IEEE Comput. Soc 15th International Conference on Pattern Recognition - Barcelona, Spain (3-7 Sept 2000)] Proceedings 15th International Conference on Pattern Recognition. ICPR-2000 - Another look at combining rejection-based pattern classifiers
Mascarilla, L., Frelicot, C.Volume:
2
Année:
2000
Langue:
english
DOI:
10.1109/icpr.2000.906038
Fichier:
PDF, 385 KB
english, 2000