
[IEEE 2014 International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO) - Taipei, Taiwan (2014.10.27-2014.10.31)] 2014 International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO) - Improving scanning speed of the AFMs with inversion-based feedforward control
Yang, Mei-Ju, Li, Chun-Xia, Gu, Guo-Ying, Zhu, Li-MinAnnée:
2014
Langue:
english
DOI:
10.1109/3m-nano.2014.7057301
Fichier:
PDF, 441 KB
english, 2014