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[IEEE 2015 Joint IEEE International Symposium on the Applications of Ferroelectric (ISAF), International Symposium on Integrated Functionalities (ISIF), and Piezoelectric Force Microscopy Workshop (PFM) - Singapore, Singapore (2015.5.24-2015.5.27)] 2015 Joint IEEE International Symposium on the Applications of Ferroelectric (ISAF), International Symposium on Integrated Functionalities (ISIF), and Piezoelectric Force Microscopy Workshop (PFM) - Hydrogen profile measurement of (Pb,La)(Zr,Ti)O3 capacitor with conductive electrode after hydrogen annealing
Takada, Yoko, Okamoto, Naoki, Saito, Takeyasu, Kondo, Kazuo, Yoshimura, Takeshi, Fujimura, Norifumi, Higuchi, Koji, Kitajima, Akira, Iwai, Hideo, Shishido, RieAnnée:
2015
Langue:
english
DOI:
10.1109/isaf.2015.7172695
Fichier:
PDF, 1.18 MB
english, 2015