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[IEEE 2015 IEEE 42nd Photovoltaic Specialists Conference (PVSC) - New Orleans, LA, USA (2015.6.14-2015.6.19)] 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC) - Methods for resistivity and thickness measurements of high resistivity interfacial layers in photovoltaic TCO multilayers
Kaufmann, Kai, Naumann, Volker, Grober, Stephan, Hagendorf, ChristianAnnée:
2015
Langue:
english
DOI:
10.1109/pvsc.2015.7356024
Fichier:
PDF, 1.11 MB
english, 2015