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[IEEE 2004 International Conference on Communications, Circuits and Systems - Chengdu, China (27-29 June 2004)] 2004 International Conference on Communications, Circuits and Systems (IEEE Cat. No.04EX914) - Error probability analysis for V-BLAST in correlated Rayleigh channels
Li Xin,, Nie Zai-ping,Année:
2004
Langue:
english
DOI:
10.1109/icccas.2004.1345990
Fichier:
PDF, 272 KB
english, 2004