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[IEEE 2015 20th IEEE European Test Symposium (ETS) - Cluj-Napoca, Romania (2015.5.25-2015.5.29)] 2015 20th IEEE European Test Symposium (ETS) - Automatic generation of autonomous built-in observability structures for analog circuits
Coyette, Anthony, Esen, Baris, Vanhooren, Ronny, Dobbelaere, Wim, Gielen, GeorgesAnnée:
2015
Langue:
english
DOI:
10.1109/ets.2015.7138754
Fichier:
PDF, 203 KB
english, 2015