[IEEE Bipolar/BiCMOS Circuits and Technology, 2004. Proceedings of the 2004 Meeting - Montreal, Canada (Sept. 12-14, 2004)] Bipolar/BiCMOS Circuits and Technology, 2004. Proceedings of the 2004 Meeting - The current mirror thermal characterization method and its implementation in a power SOI BJT process
Jonggook Kim,, Yun Liu,, De Santis, J.A., Brisbin, D.Année:
2004
Langue:
english
DOI:
10.1109/bipol.2004.1365806
Fichier:
PDF, 307 KB
english, 2004