SPIE Proceedings [SPIE International Symposium on Optoelectronic Technology and Application 2014 - Beijing, China (Tuesday 13 May 2014)] International Symposium on Optoelectronic Technology and Application 2014: Image Processing and Pattern Recognition - Image depth estimation from compressed sensing theory
Sharma, Gaurav, Zhou, Fugen, Liu, Jennifer, Du, Guangdong, Zhang, Cheng, Cheng, Hong, Liu, Yan, Wei, SuiVolume:
9301
Année:
2014
Langue:
english
DOI:
10.1117/12.2072454
Fichier:
PDF, 392 KB
english, 2014