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Advances in EELS spectroscopy by using new detector and new specimen preparation technologies
C. Scheu, M. Gao, K. Van Benthem, S. Tsukimoto, S. Schmidt, W. Sigle, G. Richter, J. ThomasVolume:
210
Année:
2003
Langue:
english
Pages:
9
DOI:
10.1046/j.1365-2818.2003.01181.x
Fichier:
PDF, 485 KB
english, 2003