SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 25 August 2013)] X-Ray Nanoimaging: Instruments and Methods - Design optimization of ultra-precise elliptical mirrors for hard x-ray nanofocusing at Nanoscopium
Lai, Barry, Kewish, Cameron M., Polack, François, Signorato, Riccardo, Somogyi, AndreaVolume:
8851
Année:
2013
Langue:
english
DOI:
10.1117/12.2026026
Fichier:
PDF, 291 KB
english, 2013