[IEEE 2013 71st Annual Device Research Conference (DRC) - Notre Dame, IN, USA (2013.06.23-2013.06.26)] 71st Device Research Conference - Comprehensive trap-level study in SiOx-based resistive switching memory
Chang, Yao-Feng, Chen, Ying-Chen, Li, Ji, Xue, Fei, Wang, Yanzhen, Zhou, Fei, Fowler, Burt, Lee, Jack C.Année:
2013
Langue:
english
DOI:
10.1109/drc.2013.6633830
Fichier:
PDF, 1.19 MB
english, 2013