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[IEEE 2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC) - Taipei, Taiwan (2015.5.26-2015.5.29)] 2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC) - Predicting EMI induced delay errors in integrated circuits: Sensitivity to the velocity saturation index
Gao, Xu, Sui, Chunchun, Hemmady, Sameer, Rivera, Joey, Andivahis, Lisa, Pommerenke, David, Beetner, DarylAnnée:
2015
Langue:
english
DOI:
10.1109/apemc.2015.7175398
Fichier:
PDF, 845 KB
english, 2015