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[IEEE 2015 IEEE International Symposium on Circuits and Systems (ISCAS) - Lisbon, Portugal (2015.5.24-2015.5.27)] 2015 IEEE International Symposium on Circuits and Systems (ISCAS) - An improved scan design for minimization of test power under routing constraint
Cui, Aijiao, Yu, Tingting, Qu, Gang, Li, MengyangAnnée:
2015
Langue:
english
DOI:
10.1109/iscas.2015.7168712
Fichier:
PDF, 881 KB
english, 2015