
SPIE Proceedings [SPIE SPIE Optifab - Rochester, New York, United States (Monday 12 October 2015)] Optifab 2015 - Gabor-domain optical coherence microscopy with integrated dual-axis MEMS scanner for fast 3D imaging and metrology
Bentley, Julie L., Stoebenau, Sebastian, Canavesi, Cristina, Cogliati, Andrea, Hayes, Adam, Santhanam, Anand P., Tankam, Patrice, Rolland, Jannick P.Volume:
9633
Année:
2015
Langue:
english
DOI:
10.1117/12.2195828
Fichier:
PDF, 980 KB
english, 2015