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Photoluminescence and Reliability Study of ZnO Cosputtered IGZO Thin-Film Transistors Under Various Ambient Conditions
Tiwari, Nidhi, Chauhan, Ram Narayan, Shieh, Han-Ping D., Liu, Po-Tsun, Huang, Yi-PaiAnnée:
2016
Langue:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2016.2525799
Fichier:
PDF, 1.27 MB
english, 2016