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[IEEE 2013 IEEE International 3D Systems Integration Conference (3DIC) - San Francisco, CA, USA (2013.10.2-2013.10.4)] 2013 IEEE International 3D Systems Integration Conference (3DIC) - Dedicated MEMS-based test structure for 3D SiP interconnects reliability investigation
Bieniek, Tomasz, Janczyk, Grzegorz, Dobrowolski, Rafal, Szmigiel, Dariusz, Ekwinska, Magdalena, Grabiec, Piotr, Pawel, Janus, Zajac, JerzyAnnée:
2013
Langue:
english
DOI:
10.1109/3dic.2013.6702375
Fichier:
PDF, 1.14 MB
english, 2013