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SPIE Proceedings [SPIE IS&T/SPIE Electronic Imaging - San Francisco, California, USA (Sunday 2 February 2014)] Digital Photography X - Depth from defocus using the mean spectral ratio
Sampat, Nitin, Tezaur, Radka, Battiato, Sebastiano, Fowler, Boyd A., Morgan-Mar, David, Arnison, Matthew R.Volume:
9023
Année:
2014
Langue:
english
DOI:
10.1117/12.2038789
Fichier:
PDF, 3.08 MB
english, 2014