SPIE Proceedings [SPIE Photonics East '96 - Boston, MA (Monday 18 November 1996)] Three-Dimensional Imaging and Laser-Based Systems for Metrology and Inspection II - New principle formula of optical triangulation displacement measurement based on light scattering from rough surface
Wang, Shao-Qing, Zhuang, Bao Hua, Zhang, Wenwei, Harding, Kevin G., Svetkoff, Donald J.Volume:
2909
Année:
1997
Langue:
english
DOI:
10.1117/12.263331
Fichier:
PDF, 388 KB
english, 1997