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SPIE Proceedings [SPIE SPIE OPTO - San Francisco, California, United States (Saturday 13 February 2016)] Smart Photonic and Optoelectronic Integrated Circuits XVIII - Benchmarking time-of-flight based depth measurement techniques
He, Sailing, Lee, El-Hang, Eldada, Louay A., Süss, Andreas, Rochus, Véronique, Rosmeulen, Maarten, Rottenberg, XavierVolume:
9751
Année:
2016
Langue:
english
DOI:
10.1117/12.2212478
Fichier:
PDF, 3.58 MB
english, 2016