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Imaging of crystalline and amorphous surface regions using time-of-flight secondary ion mass spectrometry (ToF-SIMS): applications for pharmaceutical materials
Iuras, Andreea, Scurr, David J., Boissier, Catherine, Nicholas, Mark L., Roberts, Clive J, Alexander, Morgan RussellLangue:
english
Journal:
Analytical Chemistry
DOI:
10.1021/acs.analchem.5b02621
Date:
February, 2016
Fichier:
PDF, 1.21 MB
english, 2016