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SPIE Proceedings [SPIE Applied Optics and Photonics China (AOPC2015) - Beijing, China (Tuesday 5 May 2015)] AOPC 2015: Advances in Laser Technology and Applications - Linear CCD attitude measurement system based on the identification of the auxiliary array CCD
Jiang, Shibin, Wang, Lijun, Tang, Chun, Cheng, Yong, Hu, Yinghui, Yuan, Feng, Li, Kai, Wang, YanVolume:
9671
Année:
2015
Langue:
english
DOI:
10.1117/12.2196940
Fichier:
PDF, 563 KB
english, 2015