
[IEEE 2015 IEEE 10th International Conference on Industrial and Information Systems (ICIIS) - Peradeniya, Sri Lanka (2015.12.18-2015.12.20)] 2015 IEEE 10th International Conference on Industrial and Information Systems (ICIIS) - A traceability management framework for artefacts in self-adaptive systems
Perera, Indika, Meedeniya, Dulani, Bandara, MadhushiAnnée:
2015
Langue:
english
DOI:
10.1109/ICIINFS.2015.7398982
Fichier:
PDF, 1.11 MB
english, 2015