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Comparative study of ALD SiO_2 thin films for optical applications
Pfeiffer, Kristin, Shestaeva, Svetlana, Bingel, Astrid, Munzert, Peter, Ghazaryan, Lilit, van Helvoirt, Cristian, Kessels, Wilhelmus M. M., Sanli, Umut T., Grévent, Corinne, Schütz, Gisela, Putkonen,Volume:
6
Langue:
english
Journal:
Optical Materials Express
DOI:
10.1364/OME.6.000660
Date:
February, 2016
Fichier:
PDF, 2.17 MB
english, 2016