Memory Access Time and Input Size Effects on Parallel Processors Reliability
Pilla, Laercio L., Oliveira, Daniel A. G., Lunardi, Caio, Navaux, Philippe O. A., Carro, Luigi, Rech, PaoloVolume:
62
Langue:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2015.2496381
Date:
December, 2015
Fichier:
PDF, 1014 KB
english, 2015