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X-Ray Refraction Techniques for Fast, High-Resolution Microstructure Characterization and Non-Destructive Testing of Lightweight Composites
Müller, Bernd R., Léonard, Fabien, Lange, Axel, Kupsch, Andreas, Bruno, GiovanniVolume:
825-826
Langue:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.825-826.814
Date:
July, 2015
Fichier:
PDF, 1.34 MB
english, 2015