SPIE Proceedings [SPIE Electron Technology Conference 2013 - Ryn, Poland (Tuesday 16 April 2013)] Electron Technology Conference 2013 - Electrical characterization of GaN-channel MOSFETs
Jasiński, Jakub, Łukasiak, Lidia, Jakubowski, Andrzej, Kim, Do-Kywn, Kim, Dong-Seok, Hahm, Sung-Ho, Lee, Jung-Hee, Szczepanski, Pawel, Kisiel, Ryszard, Romaniuk, Ryszard S.Volume:
8902
Année:
2013
Langue:
english
DOI:
10.1117/12.2031288
Fichier:
PDF, 364 KB
english, 2013