[IEEE 2015 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - Washington DC, USA (2015.9.9-2015.9.11)] 2015 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - Numerical simulation of percolation model for time dependent dielectric breakdown (TDDB) under non-uniform trap distribution
Choi, Seongwook, Park, Young JuneAnnée:
2015
Langue:
english
DOI:
10.1109/SISPAD.2015.7292346
Fichier:
PDF, 1.34 MB
english, 2015