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Improved reliability of large-sized a-Si thin-film-transistor by back channel treatment in H2
Lee, Hao-Chieh, Chang-Liao, Kuei-Shu, Li, Yan-LinVolume:
55
Langue:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2015.09.001
Date:
November, 2015
Fichier:
PDF, 877 KB
english, 2015