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Application of Total Internal Reflection and Heterodyne Interferometry in Electrical Conductivity Measurements
Chiu, Jyh-Shyan, Wang, Shinn-Fwu, Wang, Wen-June, Huang, Bo-Shun, Lai, Wesley, Chang, Yu-JingVolume:
16
Langue:
english
Journal:
IEEE Sensors Journal
DOI:
10.1109/JSEN.2015.2480887
Date:
January, 2016
Fichier:
PDF, 2.43 MB
english, 2016