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SPIE Proceedings [SPIE International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics - Kiev, Ukraine (Thursday 11 May 1995)] International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics - Optical diagnostics of luminescence materials for data recording
Zimenko, Vladislav I., Petrov, Viacheslav V., Kravets, Vasyliy G., Motuz, Vasily V., Prygun, Alexander V., Kozheshcurt, V. I., Svechnikov, Sergey V., Valakh, Mikhail Y.Volume:
2648
Année:
1995
Langue:
english
DOI:
10.1117/12.226225
Fichier:
PDF, 133 KB
english, 1995