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SPIE Proceedings [SPIE Optical Systems Design and Production - Berlin, Germany (Wednesday 26 May 1999)] Advances in Optical Interference Coatings - Coating requirements for the reference flat of a Fizeau interferometer used for measuring from uncoated to highly reflecting surfaces
Netterfield, Roger P., Drage, David J., Freund, Christopher H., Walsh, Christopher J., Leistner, Achim J., Seckold, Jeffrey A., Oreb, Bozenko F., Amra, Claude, Macleod, H. AngusVolume:
3738
Année:
1999
Langue:
english
DOI:
10.1117/12.360073
Fichier:
PDF, 289 KB
english, 1999