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Mobility (106 cm2 V−1 s−1) of 2DEGs, 30 nm from ex situ patterned GaAs regrowth interfaces
T.M Burke, D.A Ritchie, E.H Linfield, M.P O'Sullivan, J.H Burroughes, M.L Leadbeater, S.N Holmes, C.E Norman, A.J Shields, M PepperVolume:
51
Année:
1998
Langue:
english
Pages:
5
DOI:
10.1016/s0921-5107(97)00260-2
Fichier:
PDF, 182 KB
english, 1998