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[IEEE 2004 International Symposium on Electromagnetic Compatibility - Silicon Valley, CA, USA (9-13 Aug. 2004)] 2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) - Experimental validation of circuit models for bulk current injection (BCI) test on shielded coaxial cables
Antonini, G., Scogna, A.C., Orlandi, A., Rizzi, R.M.Volume:
1
Année:
2004
Langue:
english
DOI:
10.1109/ISEMC.2004.1349997
Fichier:
PDF, 564 KB
english, 2004