Structural investigations of sputter deposited thin films: reflection mode EXAFS, specular and non specular X-ray scattering
Dirk Lützenkirchen-Hecht, Ronald FrahmVolume:
283
Année:
2000
Langue:
english
Pages:
6
DOI:
10.1016/s0921-4526(99)01901-8
Fichier:
PDF, 205 KB
english, 2000