X-ray diffraction and reflectometry studies of porous silicon:: n-type layers and holographic gratings
V Chamard, G Dolino, G Lérondel, S SetzuVolume:
248
Année:
1998
Langue:
english
Pages:
3
DOI:
10.1016/s0921-4526(98)00211-7
Fichier:
PDF, 116 KB
english, 1998