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[IEEE 2015 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2015.4.19-2015.4.23)] 2015 IEEE International Reliability Physics Symposium - Analysis of the SET and RESET states drift of phase-change memories by low frequency noise measurements
Souiki-Figuigui, S., Sousa, V., Ghibaudo, G., Navarro, G., Coue, M., Perniola, L., Zuliani, P., Annunziata, R.Année:
2015
Langue:
english
DOI:
10.1109/IRPS.2015.7112807
Fichier:
PDF, 314 KB
english, 2015