SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California (Sunday 1 August 2010)] Reflection, Scattering, and Diffraction from Surfaces II - Improvements of nanometer particle's measuring system based on photon correlation spectroscopy
Deng, Shaoyong, Zhang, Qi, Xia, Junying, Xiong, Yan, Guo, Shaofeng, Yang, Yisheng, Gu, Zu-Han, Hanssen, Leonard M.Volume:
7792
Année:
2010
Langue:
english
DOI:
10.1117/12.859957
Fichier:
PDF, 17.18 MB
english, 2010