SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Sunday 21 June 2015)] Optical Measurement Systems for Industrial Inspection IX - Investigation on measurement of mid-frequency wavefront error for large optics in high-power laser system
Lehmann, Peter, Osten, Wolfgang, Albertazzi Gonçalves, Armando, Liu, Shijie, Jin, Chunxiang, Zhou, You, Bai, Yunbo, Zhao, Yuanan, Yi, Kui, Shao, JiandaVolume:
9525
Année:
2015
Langue:
english
DOI:
10.1117/12.2184586
Fichier:
PDF, 928 KB
english, 2015
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